|
Aug 31, 2024
|
|
|
|
EGCP 542 - VLSI Testing and Design for Testability (3) Fault model, equivalence and dominance; combinational and sequential circuit test generation ; design for testability (DFT); test compression; memory testing and diagnosis; boundary scan; testing analog circuits; mixed-signal testing strategies; logic and mixed signal built-in self test (BIST).
Prerequisite: EGCP 441 or graduate standing.
Graduate-level
Add to Portfolio (opens a new window)
|
|