Dec 12, 2019  
2017-2018 University Catalog 
    
2017-2018 University Catalog [ARCHIVED CATALOG]

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EGCP 542 - VLSI Testing and Design for Testability (3)


Fault model, equivalence and dominance; combinational and sequential circuit test generation ; design for testability (DFT); test compression; memory testing and diagnosis; boundary scan; testing analog circuits; mixed-signal testing strategies; logic and mixed signal built-in self test (BIST).

Prerequisite: EGCP 441 .



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